Vacuum adaptable sorter unit for existing processing lines

ABSTRACT

An adaptable sorter unit includes an attachment mechanism, a device that is capable of moving a first sample by use of a vacuum, a pressurized air inlet, and a valve. The pressurized air inlet is connected to the valve that controls a flow of pressurized air through the device. The valve may be electronically controlled or pneumatically controlled. The location of the adaptable sorter unit may be adjustable based, at least in part, on data captured by an optical inspector. An array of adaptable sorter units may be configured side-by-side to cover the width of the processing line. The device may be a venturi vacuum. The adaptable sorter unit may include a baseline vacuum control valve that causes a baseline vacuum force to be applied. An electrical control signal may be used to open the valve, the frequency of which may control the amount of time the valve is opened.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation-in-part and claims priority under 35U.S.C. 120 from nonprovisional U.S. patent application Ser. No.16/257,056, entitled “ADAPTABLE SORTER UNIT FOR EXISTING PROCESSINGLINES”, filed on Jan. 24, 2019, the subject matter of which isincorporated by reference. Application Ser. No. 16/257,056, is in turn acontinuation-in-part and claims priority under 35 U.S.C. 120 fromnonprovisional U.S. patent application Ser. No. 16/031,956, entitled“QUALITY INSPECTION DATA DISTRIBUTED LEDGER”, filed on Jul. 10, 2018,the subject matter of which is incorporated by reference. ApplicationSer. No. 16/031,956, is in turn a continuation-in-part and claimspriority under 35 U.S.C. 120 from nonprovisional U.S. patent applicationSer. No. 15/995,126, entitled “INSPECTION DEVICE CONTROLLED PROCESSINGLINE SYSTEM”, filed on Jun. 1, 2018, the subject matter of which isincorporated by reference. Application Ser. No. 15/995,126, in turn is acontinuation and claims priority under 35 U.S.C. § 120 fromnonprovisional U.S. patent application Ser. No. 15/817,240, entitled“INSPECTION DEVICE CONTROLLED PROCESSING LINE SYSTEM,” filed on Nov. 19,2017, the subject matter of which is incorporated herein by reference.Application Ser. No. 15/817,240, in turn, is a continuation-in-part andclaims priority under 35 U.S.C. 120 from nonprovisional U.S. patentapplication Ser. No. 15/219,870, entitled “IN-FLIGHT 3D INSPECTOR”,filed on Jul. 26, 2016, the subject matter of which is incorporated byreference.

TECHNICAL FIELD

The present invention generally relates to systems and methods forimplementing an adaptable inspection unit for existing processing lines.

BACKGROUND INFORMATION

Processing lines are widely used to inspect and sort large quantities ofa specific item. For example, processing lines are used to inspect andsort eatable items such as fruits and nuts. Alternatively, processinglines are used to inspect and sort pharmaceutical pills. A popularexample of a simple processing line is a conveyor processing line whereitems are propelled through the processing line via a conveyor belt thatis wound around the conveyor head pulley and tail pulley. Other examplesof processing lines include, but are not limited to, a flume, a rollerbelt, a shaker (conventional and linear motion), a slide, a chute, aconveyor tube, a bucket elevator, and a screw conveyor.

To date, existing processing lines, such as conveyors, have not beenadaptable to work with any improved processing devices.

SUMMARY

In a first novel aspect, an adaptable inspection unit includes anattachment mechanism, an inspection sensor device (optical receiver), adata port that is capable of transmitting information, and a power portthat is connectable to a power source. The attachment mechanism, theinspection sensor device, the data port, and the power port arephysically connected together.

In a second novel aspect, the adaptable inspection unit also includes amemory circuit and a processor circuit. The processing circuit controlsthe inspection sensor device and writes information transmitted via thedata port.

In a third novel aspect, the attachment mechanism is a mounting bracket,a mounting bracket receptacle, a weldable material (metals orthermoplastics), a clamp, an adhesive, a magnet, a latch, a lock, alocating pin, a rail, a slide, locking pin, a bolt, a screw, gravity orfriction. The attachment mechanism is used to connect the adaptableinspection unit to a processing line such that the adaptable inspectionunit is capable of capturing an image of a sample traveling along theprocessing line.

In another novel aspect, the attachment mechanism affixes the adaptableinspection unit to a location proximate to a processing line such thatthe adaptable inspection unit is capable of capturing an image of asample traveling along the processing line. In one example, theinspection is performed by an optical sensor, a moisture sensor, amicrotoxin sensor, a thermometer sensor, an acidity sensor, a microwavesensor, a pressure sensor, a level sensor, an ultrasonic sensor, a flowsensor, a viscosity sensor, a conductance/impedance sensor, a electronicnose (sniffing) sensor, an X-ray sensor, a multi spectral(visual/non-visual) sensor, a weight sensor, a refractometer sensor, atenderometer sensor, a firmness sensor, a hardness sensor, or aproximity sensor.

In yet another novel aspect, the adaptable inspection unit communicateswith a sorting device via the data port. The data port can be either awired communication port or a wireless communication port. To be clear,optical communications, such as fiber optics, are considered to be wiredcommunications. Accordingly, the current description applies to dataports that communication via electrical signals traveling on metalwires, as well as optical signals traveling through optical conductors.

In another novel aspect, the adaptable inspection unit outputs samplecharacterization data via the data port. The information transmitted bythe adaptable inspection via the data port unit causes a mode ofoperation of the sorting device to be performed.

In another novel aspect, an adaptable sorter unit includes an attachmentmechanism, a sorting device that is capable of deflecting a sample, adata port that is capable of receiving information, and a power portthat is connectable to a power source. The attachment mechanism, thesorting device, the data port, and the power port are physicallyconnected together.

In another novel aspect, the adaptable sorter unit also includes amemory circuit and a processor circuit. The processor is configured toread information received via the data port and control the sortingdevice. The sorting device is a vacuum system, a mechanical pedalsystem, an air jet system, or a mechanical gate.

In another novel aspect, the attachment mechanism is a mounting bracket,a mounting bracket receptacle, a weldable material (metals orthermoplastics), a clamp, a bolt, or a screw.

In another novel aspect, the attachment mechanism connects the adaptablesorter unit to a processing line such that the adaptable sorter unit iscapable of deflecting a sample traveling along the processing line. Inone example, the sorting is performed by a vacuum system, a mechanicalpedal system, an air jet system, or a mechanical gate.

In another novel aspect, the attachment mechanism affixes the adaptablesorter unit to a location proximate to a processing line such that theadaptable sorter unit is capable of deflecting a sample traveling alongthe processing line.

In another novel aspect, the adaptable sorter unit communicates with anoptical inspection device via the data port. The data port is either awired communication port or a wireless communication data port.

In another novel aspect, the adaptable inspection unit and/or theadaptable sorter unit is located proximate to a gap between two parts ofa processing line. For example, proximate to the location where a sampletravels from a chute portion of the processing line to a conveyorportion of the processing line. In this example, the adaptableinspection unit could be mounted so that it will inspect the samplewhile the sample travels between the chute portion of processing lineand the conveyor portion of the processing line.

In another novel aspect, an adaptable sorter unit includes an attachmentmechanism, a device that is capable of moving a first sample by use of avacuum, a pressurized air inlet, and a valve. The pressurized air inletis connected to the valve that controls a flow of pressurized airthrough the device. The valve may be electronically controlled orpneumatically controlled.

In a first embodiment, the adaptable sorter unit includes a venturivacuum.

In a second embodiment, the location of the adaptable sorter isadjustable in one or more dimensions and is determined, at least inpart, by data captured by an optical inspector.

In a third embodiment, an array of adaptable sorter units are configuredside-by-side to cover the width of the processing line and only theadaptable sorter unit above the sample to be sorted is activated.

In a fourth embodiment, an electrical control signal is used topneumatic valve that applies pressurized air to a venturi vacuum.

If a fifth embodiment, the electrical control signal is set to a firstfrequency over a first duration that causes the valve to only be openfor short periodic amounts of time during the first duration and to beclosed for the remaining periodic amounts of time during the firstduration, so that the valve only releases an amount of pressurized airthat is less than the amount of pressurized air it would have releasedif the valve were open during the entire duration.

In a sixth embodiment (not shown), a baseline vacuum control valve maybe used in addition to the pneumatic valve. The baseline vacuum controlvalve is used to apply a baseline amount of pressurized air to theventuri vacuum system before the pneumatic valve is opened.

Further details and embodiments and techniques are described in thedetailed description below. This summary does not purport to define theinvention. The invention is defined by the claims.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, where like numerals indicate like components,illustrate embodiments of the invention.

FIG. 1 is a first diagram of the in-flight 3D inspector 1 view from afirst perspective.

FIG. 2 is a second diagram of the in-flight 3D inspector 1 view from asecond perspective.

FIG. 3 is a third diagram of the in-flight 3D inspector 1 view from aright side view.

FIG. 4 is a fourth diagram of the in-flight 3D inspector 1 view from aleft side view.

FIG. 5 is a diagram of the in-flight 3D inspector 1 illustrating thepath a sample travels through the in-flight 3D inspector 1.

FIG. 6 is a diagram of a double stereo camera system configuration withtriggering.

FIG. 7 is an image captured by a first camera of the double stereocamera system.

FIG. 8 is an image captured by a second camera of the double stereocamera system.

FIG. 9 is an image captured by a third camera of the double stereocamera system.

FIG. 10 is an image captured by a fourth camera of the double stereocamera system.

FIG. 11 is a flowchart of an in-flight 3D inspector.

FIG. 12 is a flowchart of an in-flight 3D inspector with defectprocessing.

FIG. 13 is a diagram of an inspection device.

FIG. 14 is a diagram of an inspection data communication system.

FIG. 15 is a diagram of a command communication system.

FIG. 16 is a diagram of an inspection data control system using a remotecomputing device.

FIG. 17 is a diagram of an inspection data control system of multipleprocessing lines using a remote computing device.

FIG. 18 is a diagram of a first example of inspection data.

FIG. 19 is a diagram of a second example of inspection data.

FIG. 20 is a diagram of a third example of inspection data.

FIG. 21 is a diagram of a first example of a command based on inspectiondata.

FIG. 22 is a diagram of a second example of a command based oninspection data.

FIG. 23 is a diagram of a third example of a command based on inspectiondata.

FIG. 24 is a flowchart illustrating the operation of an inspection datacommunication system.

FIG. 25 is a flowchart illustrating the operation of a commandcommunication system.

FIG. 26 is a flowchart illustrating a first example of the operation ofan inspection data communication system using a remote computing device.

FIG. 27 is a flowchart illustrating a second example of the operation ofan inspection data communication system.

FIG. 28 is a quality inspection data distributed ledger flowchart.

FIG. 29 is a diagram of a quality inspection data block in a qualityinspection distributed ledger.

FIG. 30 is a diagram of a conveyor for manual inspection or sorting.

FIG. 31 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor.

FIG. 32 is a diagram of a conveyor with an adaptable sorting unitattached to the conveyor.

FIG. 33 is a diagram of a conveyor with an adaptable inspection unitattached to the ceiling above the conveyor.

FIG. 34 is a diagram of a conveyor with an adaptable sorting unitattached to a ceiling above the conveyor.

FIG. 35 is a diagram of a conveyor with an adaptable inspection unitattached to a mounting stand.

FIG. 36 is a diagram of a conveyor with an adaptable sorting unitattached to a mounting stand.

FIG. 37 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor sidewall. The adaptable inspection unit can beattached permanently or temporarily to the conveyor sidewall.

FIG. 38 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor and an adaptable sorting unit attached to theconveyor.

FIG. 39 is a block diagram of an adaptable inspection unit.

FIG. 40 is a block diagram of an adaptable sorter unit.

FIG. 41 is a flowchart illustrating the operations performed by anadaptable inspection unit.

FIG. 42 is a flowchart illustrating the operations performed by anadaptable sorting unit.

FIG. 43 is a diagram of an adaptable inspection unit and vacuumadaptable sorter unit that utilizes pressurized air.

FIG. 44 is a side-view diagram of a vacuum adaptable sorter unit thatutilizes pressurized air.

FIG. 45 is a diagram illustrating the operation of a venture vacuum. A

FIG. 46 is a front-view diagram of an adaptable inspection unit andvacuum adaptable sorter unit utilizing pressurized air with x-y-zlocation adjustment.

FIG. 47 is a top-down diagram of an adaptable inspection unit and vacuumadaptable sorter unit utilizing pressurized air with x-y-z locationadjustment.

FIG. 48 is a front-view diagram of an adaptable inspection unit andarray of fixed location vacuum adaptable sorter units utilizingpressurized air.

FIG. 49 is a top-down diagram of an adaptable inspection unit and arrayof fixed location vacuum adaptable sorter units utilizing pressurizedair.

FIG. 50 is a perspective diagram of an adaptable inspection unit andarray of fixed location vacuum adaptable sorter units utilizingpressurized air.

FIG. 51 is a flowchart describing the steps of enabling a vacuumadaptable sorter unit that utilizes pressurized air.

DETAILED DESCRIPTION

Reference will now be made in detail to background examples and someembodiments of the invention, examples of which are illustrated in theaccompanying drawings. In the description and claims below, relationalterms such as “top”, “down”, “upper”, “lower”, “top”, “bottom”, “left”and “right” may be used to describe relative orientations betweendifferent parts of a structure being described, and it is to beunderstood that the overall structure being described can actually beoriented in any way in three-dimensional space.

Due to the drawbacks of human visual inspection, an automated inspectoris needed to quickly, inexpensively and accurately detect defectspresent in objects such as tree nuts, tablets, screws and many othertypes of objects. Some of the most important features of such anautomatic inspector include: cost, number of objects inspected perminute, accuracy of defect detection, reliability of defect detectionand ease of use with minimal user training.

FIG. 1 is a first diagram of the in-flight 3D inspector 1 view from afirst perspective. The in-flight 3D inspector 1 includes a display 2, adisplay support arm 3, a sample input funnel 4, a power switch 5, anoptical system mounting frame 6, an axial fan 7, a first light source 9,a second light source 8, an RJ-45 connector 10, a collector bin 11, anda computer system 12. The display 2 outputs information from thecomputer system 12 to a human user looking at the display. The displaysupport arm 3 attaches the display 2 to the in-flight 3D inspector 1. Inone example, the display support arm is adjustable with two hinges asshown in FIG. 1. In another example, the display support arm 3 isadjustable in additional dimensions (not shown in FIG. 1). The sampleinput funnel 4 is where samples are input to the in-flight 3D inspector.Power switch 5 is used by a human user to turn on (or off) the in-flight3D inspector. The light sources are mounted to the optical systemmounting frame 6. The axial fan 7 is used to create positive pressure ina camera enclosure (not shown in FIG. 1). In one example, the axial fan7 is coupled to a first hose that directs air flow to a first cameraenclosure and is coupled to a second hose that directs air flow to asecond camera enclosure (not shown). The hoses can be fixed or flexiblehoses made of various materials including various plastics, fiberglassand metal materials. In this fashion, positive pressure in each cameraenclosure is created. The positive pressure prevents debris fromentering the camera enclosures and settling on any of the cameras. RJ-45connector 10 is configured to receive an RJ-45 cable connected to alocal network and electrically connect the RJ-45 cable to a networkinput port included on the computer system 12. The RJ-45 cable may be anEthernet cable (not shown). Via the RJ-45 connector 10 and a RJ-45Ethernet cable, the computer system 12 can connect to a local network orthe public Internet. The computer system 12 may also include a wirelessnetworking card (not shown) that allows computer system 12 to wirelesslycommunicate (i.e. WiFi or cellular connection) with a network withoutthe need for a wired connection. The collector bin 11 is configured tocollect samples that have completed their path through the in-flight 3Dinspector.

FIG. 2 is a second diagram of the in-flight 3D inspector 1 view from asecond perspective. FIG. 2 illustrates a sample chute 13 that isconfigured to guide a sample from the sample input funnel 4. Thelocation of a power management module 14 is also shown in FIG. 14. Thepower management module 14 receives input power from the local powergrid and generates power signals for the various electrical componentsoperating within the in-flight 3D inspector 1. For example, the powermanagement module 14 generates a power signal that is used to power thevarious light sources, the various cameras (not shown), the axial fan,the display and the computer system. In one example, the powermanagement module 14 includes a battery which can be used to operate thein-flight 3D inspector when power from the local power grid is lost.

FIG. 3 is a third diagram of the in-flight 3D inspector 1 view from aright side view. FIG. 3 shows a first camera pair 18 and a second camerapair 19. FIG. 3 also illustrates that sample chute 13 is aligned withthe midpoint between the first camera pair 18 and the second camera pair19. The physical arrangement of the first camera pair 18 and the secondcamera pair 19 is illustrated in FIG. 6. FIG. 6 illustrates that thefirst camera pair 18 includes a first camera 21 and a second camera 22.The second camera pair 19 includes a third camera 23 and a fourth camera24. All four cameras are focused on the same focal plane. The focalplane is located at the midpoint between the first camera pair 18 andthe second camera pair 19. As discussed above regarding FIG. 3, thechute is also aligned with the midpoint between the first camera pair 18and the second camera pair 19.

Camera Positioning

The four cameras are positioned such that each camera is focused on thefocal plane. Each camera utilizes a lens to focus on the focal plane. Inone example, wide angle lenses are used by each camera. One example of awide angle lens is FL-BC1618-9M Ricoh lens. This wide angle lens has aformat size of 1″ format, a focal length of sixteen millimeters, amaximum aperture ratio of 1:1.8, an iris range of 1.8 to 16, and aresolution of nine mega-pixels. Other types of lenses may be used toachieve the necessary focus of each camera on the focal plane.

FIG. 4 is a fourth diagram of the in-flight 3D inspector 1 view from aleft side view. FIG. 4 illustrates that a third light source 15 and afourth light source 16 are also included in the in-flight 3D inspector1. In one example, the first, second, third and fourth light sources aremounted to the optical system mounting frame 6. In another example, thelight sources are mounted directly to outer frame of the in-flight 3Dinspector 1 (not shown). After reading of the present disclosure, oneskilled in the art will readily appreciate the various ways that lightsources and cameras can be physically mounted within the in-flight 3Dinspector 1.

FIG. 5 is a diagram of the in-flight 3D inspector 1 illustrating thepath a sample travels through the in-flight 3D inspector 1. First, asample 17 is placed into the sample input funnel 4. The sample inputfunnel 4 directs the sample 17 to sample chute 13. In one example, thesample input funnel 4 is configured to vibrate such that sample 17 isdirected toward sample chute 13. Sample chute 13 directs the sample 17to a focal plane where the first camera pair 18 and the second camerapair 19 are both focused. In-flight 3D inspector 1 may be used togenerate images of various types of samples, such as tree nuts, apeanuts, tablets, screws and washers.

Triggering System

Before the sample 17 reaches the focal plane, a trigger senses thepresence of the sample 17 near the sample chute 13 and generates atrigger signal. In one example, the trigger is attached to the samplechute 13 and includes an optical transmitter and an optical receiver. Inoperation, the sample 17 interferes with the light traveling between theoptical transmitter and the optical receiver as sample 17 travels alongsample chute 13. This interference in received light is sensed by theoptical receiver when the transmitted light does not irradiate theoptical receiver. In response to detecting the interference in receivedlight, the trigger generates a trigger signal. The trigger signal can bean electric signal that propagates along a conductor, or the triggersignal can be an electro-magnetic signal that propagates across freespace to a receiving terminal. The duration between the time when thetrigger signal is generated and the time when the sample 17 intersectsthe focal plane is based on where the trigger is located relative to thefocal plane of the camera pairs. Once the trigger location is selectedthe duration between the time when the trigger signal is generated andthe time when the sample 17 intersects the focal plane can beempirically measured or calculated. Once the duration between when thetrigger signal is generated and the time when the sample 17 intersectsthe focal plane has been determined, the trigger signal can be used todetermine the future time when the sample 17 will intersect the focalplane. This timing information can be used to properly control thevarious light sources and cameras in the in-flight 3D inspector.

The trigger is not shown in FIG. 5. However, a system diagram of thetriggering system is illustrated in FIG. 6. FIG. 6 is a diagram of adouble stereo camera system configuration with triggering. Thetriggering system includes trigger 30, controller 31 and/or computersystem 12, cameras 21-24 and light sources 8-9 and 15-16. In oneexample, the trigger signal 32 (i) causes light sources 8, 9, 15, and 16to turn on, and (ii) causes the first camera pair 18 and the camera pair19 to capture an image when the sample 17 intersects in the focal plane.In another example, light sources 8, 9, 15 and 16 are already on and thetrigger signal 32 only causes the first camera pair 18 and the camerapair 19 to capture an image when the sample 17 intersects in the focalplane.

In a first embodiment, the trigger signal is communicated from thetrigger 30 to a controller 31 that controls when the first camera pair18 and the second camera pair 19 capture images. In a second embodiment,the trigger signal 32 is communicated from the trigger 30 directly tothe first camera pair 18 and the second camera pair 19 and causes thecamera pairs 18 and 19 to capture images. In a third embodiment, thetrigger signal 32 is communicated from the trigger 30 to computer system12 that controls when the first camera pair 18 and the second camerapair 19 capture images.

In a fourth embodiment, the trigger signal is communicated from thetrigger 30 to a controller 31 that controls when the light sources 8-9and 15-16 are turned on. The controller 31 acts as a switch thatconnects an output power terminal of a power supply included in powermanagement module 14 to a power input terminal of each light source 8-9and 15-16. The controller switch turns ON the light sources in responseto receiving the trigger signal. After the sample has passed though thefocal plane, the controller turns OFF the light sources by disconnectingthe output power terminal of the power supply from the power inputterminal of each light source.

In a fifth embodiment, the trigger signal 32 is communicated from thetrigger 30 directly to the light sources 8-9 and 15-16 and causes thelight sources 8-9 and 15-16 to turn ON. In this embodiment, each lightsource 8-9 and 15-16 is configured to receive a power signal and anON/OFF signal. The ON/OFF signal is controlled by the trigger signal.The light sources may include a timer circuit that is used to turn OFFthe light sources after the sample has passed through the focal plane.

In a sixth embodiment, the trigger signal 32 is communicated from thetrigger 30 to computer system 12 that controls when the light sources8-9 and 15-16 are turn on. In this embodiment, each light source 8-9 and15-16 is configured to receive a power signal and an ON/OFF signal. TheON/OFF signal is output by the computer system 12 in response toreceiving the trigger signal from the trigger.

The light sources may be controlled such that the light sources turn onafter the camera shutters are opened and turn off before the camerashutters are closed.

Controller 31 may be configured to communicate with computer system 12via an RS232 communication link, an Ethernet communication link, anUniversal Serial Bus (USB) communication link, or any other availabledata communication links.

When the sample 17 travels through the focal plane, sample 17 is notcontacting any surface. At this point in time, the light sources 8-9 and15-16 are turned on and the first camera pair 18 and the second camerapair 19 capture at least one image of the sample. Each camera capturesan image from a unique angle at the same moment in time as the sampletravels through the focal plane. FIG. 7 is an image captured by a firstcamera of the double stereo camera system. FIG. 8 is an image capturedby a second camera of the double stereo camera system. FIG. 9 is animage captured by a third camera of the double stereo camera system.FIG. 10 is an image captured by a fourth camera of the double stereocamera system. Each of these images is stored on a memory device locatedon the in-flight 3D inspector. On one example, the memory device islocated within the computer system 12. It is noted that the capturedimages may only be temporarily stored on a memory device within thein-flight 3D inspector before being communicated across a network toanother storage device located outside of the in-flight 3D inspector.For example, the captured images stored on a storage device within thecomputer system 12 may be communicated across RJ-45 connector 10 and alocal network to another storage device not included in the in-flight 3Dinspector. In this fashion, multiple images of the sample 17 arecaptured from four different angles at the same moment while the sample17 is traveling through the focal plane while not in contact with anysurface.

Capturing of images while the sample is not contacting any surfaceprovides a great benefit. When the sample is not contacting any surface,images of each surface of the sample can be collected at the same momentin time. This is not possible in other image capturing systems. Forexample, when a sample is moved along a conveyer belt image of only oneside of the sample may be captured at any one moment in time. View ofthe other side of the sample is blocked by the conveyer belt andtherefore cannot be captured at the same moment in time. Capturingimages of all surfaces of the sample at the same moment in time allowsfor generation of high quality 3D images of the sample. When images ofvarious surfaces of the sample are taken at different moments in time,proper alignment of images is very difficult, requires additionalprocessing and result in 3D images with lower quality due to introducederror.

The cameras communicate the captured images to the controller 31 orcomputer system 12 via bus. In one example, the bus is a UniversalSerial Bus (USB). In another example, the bus is an IEEE 1394 “FireWire”bus.

In one example, the cameras (also referred to herein as an “imagecapturing device” or “optical receiver”) are Charged Coupled Device(CCD) cameras. In another example, the cameras (also referred to hereinas an “image capturing device” or “optical receiver”) are ComplementaryMetal-Oxide Semiconductor (CMOS) cameras. In yet another example, thecameras (also referred to herein as a “image capturing device” or“optical receiver”) are Indium Gallium Arsenide (InGaAs) cameras thatare capable of measuring Short Wave Infra Red (SWIR) light.

Either line scan cameras and area scan cameras can be used to implementan in-flight 3D inspector. A line scan cameras contain a single row ofpixels used to capture data very quickly. As the object moves past thecamera, a complete image can be reconstructed in software line by line.Area scan cameras contain a matrix of pixels that capture an image of agiven scene. They are more general purpose than line scan cameras, andoffer easier setup and alignment.

It is noted herein that the light sources may each include a separatepower source that drives the light when a control signal is received.Alternatively, each light source may be configured in an always on statewhere the power input terminal on each light source is coupled to anoutput terminal of a power supply where the output of the power supplyis controlled by a control signal.

It is noted that the sample chute 13 is only one example how the samplecan be directed to the focal plane. In a first alternative embodiment,the sample can be directed to the focal plane by use of a conveyer belt.In this first alternative embodiment, the sample would be directed fromthe sample input funnel to the conveyer belt, which in turn would propelthe sample off the edge of the conveyer belt toward the focal plane. Ina second alternative embodiment, the sample can be directed to the focalplane by use of an airburst. In this second alternative embodiment, thesample would be directed proximate to an airburst source, which in turnwould propel the sample toward the focal plane. One example of anairburst source is a highly pressurized air tank connected to anelectronically controlled valve, which outputs an airburst momentarilywhile the valve is open.

Sample Collection/Sorting

Once the sample 17 passes the focal plane, the sample 17 falls intocollector bin 11. In one example, a collector bucket 20 is placed incollector bin 11. In this example, the sample 17 falls into thecollector bucket 20. Additional samples placed into sample input funnel4 make their way through the in-flight 3D inspector and eventually alsofall into collector bucket 20. Once all samples have passed through thein-flight 3D inspector, a user can remove all samples by removing thecollector bucket 20 from the collector bin 11.

In another example, a collector bucket 20 is not placed in collector bin11. Rather, collector bin 11 is coupled to a sample sorting machine (notshown). In this example, the samples that pass through the in-flight 3Dinspector are routed into different bins. The bin each sample is routedinto is based on the images captured of the sample. In the event thatthe images of the sample indicate that the sample has a first type ofdefect, then the sample is routed to a first bin. In the event that theimages of the sample indicate that the sample has a second type ofdefect, then the sample is routed into a second bin. Alternatively, inthe event that the images of the sample indicate that the sample doesnot have any defects, then the sample is routed to a third bin. Thesorting machine can route the samples using various different methods. Afirst method of routing includes using a burst of air to redirect thetrajectory of a sample as it falls into the collector bin. A secondmethod of routing includes using a mechanically controlled flap toredirect the trajectory of a sample as it falls into the collector bin.

3D Image Generation

Once the images are captured from each of the cameras, a 3D image of thesample can be created. In one example, the 3D image is generated by thecomputer system 12 included in the in-flight 3D inspector. In anotherexample, the 3D image is generated by another computer system notincluded in the in-flight 3D inspector after the images are communicatedacross a network from the in-flight 3D inspector to the computer systemnot included in the in-flight 3D inspector.

The images captured by the first camera pair 18 are used to create a 3Dimage of a first side of the sample. The images captured by the secondcamera pair 19 are used to create a 3D image of the second side of thesample. In one example, data included in the captured 2D images arecombined into a new dataset and missing information is added to completethe 3D information of the object: depth (distance). By usingtriangulation on matching pixels of the multiple 2D images captured bythe in-flight 3D inspector, the depth component is derived and added tothe dataset. This new dataset describes the object in 3D. This datasetis then used by advanced mathematical algorithms to describe thecharacteristics of the objects. The 3D images of the first and secondsides of the sample are combined to create a 3D image of the entiresample. Once the 3D image of the entire sample is constructed, the 3Dimage can be analyzed to determine if various types of defects arepresent on the sample. For example, if the 3D image does not match apredetermined shape within a specified tolerance, then the sample isdetermined to be defective with respect to shape. In another example, ifthe 3D image shows a flat surface greater than a specified area, thenthe sample is determined to be defective with respect to surfacecontour.

Once the defect information is determined based on the 3D image of thesample, the defect information is stored with the 3D image. The defectinformation can be displayed on display 2 to a user of the in-flight 3Dinspector. The defect information can also be used to generate a reportindicating the number of defects detected across a multiple samples thathave been inspected. The defect information for each sample can be usedby a sorting machine attached to the collector bin 11 of the in-flight3D inspector to determine how the sample is to be routed. The defectinformation for multiple samples can be used to generate a qualityreport indicating the quality grade of the multiple samples.

Various calibrations of the cameras may be performed. An internalcalibration may be performed for each camera. Internal calibrationincludes calibration of principle points, focal lengths, pixel sizeratios, and radial parameters. A stereo calibration may be performed aswell. A stereo calibration addresses the external 3D rotation andtranslation between individual cameras of a stereo system. Aninter-stereo calibration may also be performed to address the external3D rotation and translation between the two stereo systems. In aninter-stereo calibration, a transformation is performed that stitchestwo different side reconstructions into one 3D model.

Capturing Images of Multiple Samples in a Single Image

The single sample chute 13 illustrated in FIG. 5 illustrates oneembodiment of the present invention. In another embodiment (not shown inFIG. 5) the sample chute may be configured to direct multiple samplesthrough the focal plane at the same moment in time. In this embodiment,the sample chute would cause multiple samples to fall through the focalplane along a single axis at the same time. Aligning the samples along asingle axis prevents one sample from blocking a camera's view of anothersample. The first and second camera pairs would then capture an imageincluding multiple samples instead of just one. Said another way, asingle image would include multiple samples instead of just one. Oncethe images of the multiple samples are captured, the computer system 12would (i) determine which portions of each image are of each sample, and(ii) only use the portions of each image that are of the same sample togenerate the 3D image of the sample.

This configuration would greatly accelerate the rate at which thein-flight 3D inspector can capture images of multiple samples. Forexample, if the sample chute directed ten samples through the focalplane as the same time instead of only one sample, then the in-flight 3Dinspector would be able to collect images of samples ten times faster.Said another way, the in-flight 3D inspector would only requireone-tenth the amount of time to collect images of a set of samples.

FIG. 11 is a flowchart 200 of an in-flight 3D inspector. In step 201, asample is propelled through a focal plane of a dual stereo camerasystem. In step 202, a trigger signal is generated. The trigger signalindicates when the sample will travel through the focal plane of thestereo camera system. In step 203, a predetermined amount of time afterthe trigger signal is generated, an image of the sample is captured byeach camera included in the dual stereo camera system. The sample isilluminated by a light source while the image of the sample is captured.In step 204, the sample is collected in a collector bin and the capturedimages are stored in a memory device.

FIG. 12 is a flowchart 300 of an in-flight 3D inspector with defectprocessing. In step 301, a sample is propelled through a focal plane ofa dual stereo camera system. In step 302, a trigger signal is generated.The trigger signal indicates when the sample will travel through thefocal plane of the stereo camera system. In step 303, a predeterminedamount of time after the trigger signal is generated, an image of thesample is captured by each camera included in the dual stereo camerasystem. The sample is illuminated by a light source while the image ofthe sample is captured. In step 304, the sample is collected in acollector bin and the captured images are stored in a memory device. Instep 305, the captured images are stitched together to generate a 3Dimage of the sample. In step 306, the 3D image of the sample is used todetermine one or more characteristics of the sample.

Various Numbers of Cameras can be Used

The two pairs of cameras 18-19 discussed above are used in a firstembodiment of the present invention. In other embodiments, various othernumbers of cameras may be used. For example, in another embodiment, thein-flight 3D inspector may include only one pair of stereo cameras thatcapture two images of the sample and the images are used to construct a3D image of the sample from only one point of view. In anotherembodiment, three pairs of stereo cameras can be used to capture siximages of the sample and the images are used to construct a 3D image ofthe sample from three points of view. After review of this disclosure,the reader will appreciate that additional cameras will provideadditional accuracy of the 3D image created by the in-flight 3Dinspector.

Inspection Device Controlled Processing Line System

FIG. 13 is a diagram of an inspection device 400. Inspection device 400includes a processor 401, a storage device 402, an interface circuit403, an optical device 404 and/or other sensors 405. The various partsof inspection device 400 communicate with each other across a bus 406.On skilled in the art will note that various known bus architectures canbe used to implement inspection device 400. One example of a busarchitecture is Peripheral Component Interconnect Express (PCIe), whichprovides standardized communication between various device components.However, many other possible options exist, such as: Ethernet forControl Automation Technology (EtherCAT), Ethernet Industrial Protocol(EtherNet/IP), Process Field Net (PROFINET), Ethernet Powerlink, ThirdGeneration of the Sercos Interface (SERCOS III), Control andCommunication Link (CC-Link IE), and Modbus/TCP, Modbus, Sinec H1,Process Field Bus (Profibus), Controller Area Network Protocol(CANopen), DeviceNet, and FOUNDATION Fieldbus. One example of aprocessor is an intel x86 processor. One example of a storage device isa NAND flash based solid state drive. One example of an interfacecircuit is a Network Interface Card (NIC) that communicates across aphysically connected cable to a network switch or router. Anotherexample of an interface circuit is a Wireless Network InterfaceController (WNIC) that communicates across standards such as WiFi(802.11 protocols), Bluetooth and other such protocols. Another exampleof an interface circuit is a cellular communication device thatcommunicates across cellular networks that use protocols such as GSM,WCDMA, CDMA2000, LTE, etc. All of the above mentioned communicationmethods may be used to implement a data port. An example of an opticaldevice is a high shutter speed, high resolution digital camera that iscontrollable by a computer across a standardized data port, such as USB.Other examples of optical devices include, but are not limited to,millimeter wave cameras, Near-Infr-Red (NIR) cameras, hyper-spectralcameras, and x-ray cameras. Other sensors 405 may include audio,electromagnetic, and odor sensors that are controllable by a computeracross a standardized bus, such as USB. Other examples of sensorsinclude, but are not limited to weight scale sensors, proximity sensors,temperature sensors, humidity sensors, texture sensors, and moisturesensors.

FIG. 14 illustrates an inspection data communication system. Theinspection data communication can be between inspection device 412 andupstream slave device 411 or between inspection device 412 anddownstream slave device 413. The terms upstream indicates that samplepass through the slave device before passing through the inspectiondevice 412. The term downstream indicates that samples pass through theinspection device 412 before passing through the salve device.

It is noted herein, that a slave device is any device located along thesample processing line. Examples of a slave devices includes, but is notlimited to: a sorting device, a mixing device, a display device, asizing device, a blanching device, a feeding device, a cutting, aslicing device, a baking device, a drying device, a freezing device, acoating device, a washing device.

In one scenario, a sample passes through the slave device 411 and thenpasses through the inspection device 412. Within the inspection device412, the optical device 404 of the inspection device 400 is triggered bythe processor 401 to capture an image. The triggering by the processor401 is executed when a sample is within the field of view of the opticaldevice 404. The image captured by the optical device 404 is then storedinto storage device 402. The processor 401 then processes the capturedimage and determines one or more quality characteristics of the samplein the captured image. Many different quality characteristics may bedetermined from the captured image. Some examples of possible qualitycharacteristics includes, but are not limited to: shape quality (basedon matching a predetermined shape within a specified tolerance, then thesample is determined to be defective with respect to shape), surfacecontour quality (when a flat surface is greater than a specified area,then the sample is determined to be defective with respect to surfacecontour), hole quality (presence of holes in the sample), pest quality(presence of insects in/or on the sample), color quality (irregularcolor of the sample), size quality (irregular size of the sample),moisture level, oil content, fat content, and mycotoxin content. In oneexample, a group of quality characteristics are referred to asinspection data 415. FIG. 18, FIG. 19, and FIG. 20 illustrate variousexamples of inspection data. Communication medium 417 can be a wiredmedium such as Ethernet or RS-232. Alternatively, communication medium417 can be wireless medium such as WiFi (802.11) or a cellular link. Theinspection data 415 is then communicated to slave device 411. In thisfashion, the slave device 411 can then analyze the inspection data andadjust the operation of slave device 411 such that more desirablesamples are output from slave device 411. This scenario requires thatslave device 411 include some local knowledge and processing capabilityto analyze the received inspection data and to adjust the operations ofthe slave device 411 based on the analysis.

It is noted herein, the inspection device 400 illustrated in FIG. 13 isonly one example of an inspection device. Another example of aninspection device is the in-flight 3D inspector 1 illustrated in FIGS.1-5.

It is also noted herein, that multiple samples may be within the fieldof view of the optical device 404 when an image is captured andtherefore quality characteristics of multiple samples may be determinedusing a single captured image.

In another scenario, a sample passes through the inspection device 412and then passes through the slave device 413. Within the inspectiondevice 412, the optical device 404 of the inspection device 400 istriggered by the processor 401 to capture an image. The triggering bythe processor 401 is executed when a sample is within the field of viewof the optical device 404. The image captured by the optical device 404is then stored into storage device 402. The processor 401 then processesthe captured image and determines one or more quality characteristics ofthe sample in the captured image. Many different quality characteristicsmay be determined from the captured image. In one example, multiplequality characteristics are referred to as inspection data 415. Theinspection data 415 is then communicated to slave device 413 viacommunication medium 417. Communication medium 417 can be a wired mediumsuch as Ethernet or RS-232. Alternatively, communication medium can bewireless medium such as WiFi (802.11) or cellular link In this fashion,the slave device 413 can then analyze the inspection data and adjust theoperation of slave device 413 such that more desirable samples areoutput from slave device 413. This scenario requires that slave device413 include some local knowledge and processing capability to analyzethe received inspection data and to adjust the operations of the slavedevice 413 based on the analysis.

While the scenario illustrated in FIG. 14 provides the slave devices 411and 413 with the most control over how they operate, in many instancesslave devices 411 and 413 will not have the necessary knowledge andprocessing power to analyze the inspection data generated by theinspection device 412. This problem is addressed by moving theprocessing of the inspection data to the inspection device 412. Thissolution is illustrated in FIG. 15.

FIG. 15 illustrates a command communication system. The terms upstreamindicates that sample pass through the slave device before passingthrough the inspection device 422. The term downstream indicates thatsamples pass through the inspection device 422 before passing throughthe slave device. In this system, a sample passes through the slavedevice 411 and then passes through the inspection device 412. Within theinspection device 412, the optical device 404 of the inspection device400 is triggered by the processor 401 to capture an image. Thetriggering by the processor 401 is executed when a sample is within thefield of view of the optical device 404. The image captured by theoptical device 404 is then stored into storage device 402. The processor401 then processes the captured image and determines one or more qualitycharacteristics of the sample in the captured image. In one example,multiple quality characteristics are referred to as inspection data.Instead of communicating the raw inspection data to the slave device421, the inspection device 422 performs the analysis of the inspectiondata and generates a command 425 to adjust the operation of slave device421. FIG. 21, FIG. 22, and FIG. 23 illustrate various examples ofcommands that are generated based on inspection data. For example, acommand may be to set a threshold value to be used by a slave device. Inanother example, a command may be to set a mixing ratio value in a slavedevice. In yet another example, the command may be to adjust a set-pointvalue in a slave device. The command 425 is then communicated to slavedevice 421 via communication medium 427. Slave device 421 then adjustsoperation as commanded such that more desirable samples are output fromslave device 421. This scenario does not require that slave device 421include some local knowledge and processing capability to analyzeinspection data and to adjust the operations of the slave device 421based on the analysis. Rather, this scenario does not require any localknowledge or processing capability to be present on the slave device421, because all the necessary analysis is performed by the inspectiondevice 422. Slave device 421 can operate as a “dumb” terminal thatsimply adjusts operation based on received commands from the inspectiondevice 422. This solution may be very valuable as it reduces the numberof devices that are required to have local processing capability andknowledge, which in turn reduces the cost of the overall system.

In another scenario, a sample passes through the inspection device 422and then passes through the slave device 423. Within the inspectiondevice 412, the optical device 404 of the inspection device 400 istriggered by the processor 401 to capture an image. The triggering bythe processor 401 is executed when a sample is within the field of viewof the optical device 404. The image captured by the optical device 404is then stored into storage device 402. The processor 401 then processesthe captured image and determines one or more quality characteristics ofthe sample in the captured image. In one example, multiple qualitycharacteristics are referred to as inspection data. Instead ofcommunicating the raw inspection data to the slave device 423, theinspection device 422 performs the analysis of the inspection data andgenerates a command 426 to adjust the operation of slave device 423. Thecommand 426 is then communicated to slave device 423 via a communicationmedium. Slave device 423 then adjusts operation as commanded such thatmore desirable samples are output from slave device 423. This scenariodoes not require that slave device 423 include some local knowledge andprocessing capability to analyze inspection data and to adjust theoperations of the slave device 423 based on the analysis. Rather, thisscenario does not require any local knowledge or processing capabilityto be present on the slave device 423, because all the necessaryanalysis is performed by the inspection device 422. Slave device 423 canoperate as a “dumb” terminal that simply adjusts operation based onreceived commands from the inspection device 422. This solution may bevery valuable as it reduces the number of devices that are required tohave local processing capability and knowledge, which in turn reducesthe cost of the overall system.

While the scenario illustrated in FIG. 15 provides cost saving by onlyrequiring a single device in the system to have the necessary knowledgeand processing power, it may be even more advantageous if the none ofthe devices in the system are required to have local processingcapability and knowledge to analyze the captured images. FIG. 16illustrates an inspection data control system using a remote computingdevice.

FIG. 16 illustrates an inspection data control system using a remotecomputing device. The terms upstream indicates that sample pass throughthe slave device before passing through the inspection device 432. Theterm downstream indicates that samples pass through the inspectiondevice 432 before passing through the salve device. In this system, asample passes through the slave device 431 and then passes through theinspection device 432. Within the inspection device 432, the opticaldevice 404 of the inspection device 400 is triggered by the processor401 to capture an image 438. The triggering by the processor 401 isexecuted when a sample is within the field of view of the optical device404. The image 438 captured by the optical device 404 is then storedinto storage device 402. The processor 401 does not process the capturedimage 438 to determine one or more quality characteristics of the samplein the captured image 438. Rather, the inspection device 432communicates the captured image 438 to a remote computing device 434. Inone example, remote computing device 434 is a remote computer or serverthat is not part of any machine through which the sample flows. Inresponse to receiving the captured image 438, the remote computingdevice 434 performs the analysis of the captured image 438 and generatesa command 436 to adjust the operation of slave device 431. The command436 is then communicated to slave device 431 via communication medium437. Slave device 431 then adjusts operation as commanded such that moredesirable samples are output from slave device 431. This scenario doesnot require any local knowledge or processing capability to be presenton the slave device 431, because all the necessary analysis is performedby the remote computing device 434. Likewise, this scenario does notrequire any local knowledge or processing capability to be present onthe inspection device 432, because all the necessary analysis isperformed by the remote computing device 434. Both slave device 431 andinspection device 432 can operate as “dumb” terminals that simply adjustoperation based on received commands from the remote computing device434. This solution may be very valuable as it does not require anydevices through which the sample passes to have local processingcapability and knowledge, which in turn reduces the cost of the overallsystem.

In another scenario, a sample passes through the inspection device 432and then passes through the slave device 433. Within the inspectiondevice 432, the optical device 404 of the inspection device 400 istriggered by the processor 401 to capture an image 438. The triggeringby the processor 401 is executed when a sample is within the field ofview of the optical device 404. The image 438 captured by the opticaldevice 404 is then stored into storage device 402. The processor 401does not process the captured image 438 to determine one or more qualitycharacteristics of the sample in the captured image. Rather, theinspection device 432 communicates the captured image 438 to a remotecomputing device 434. In one example, remote computing device 434 is aremote computer or server that is not part of any machine through whichthe sample flows. In response to receiving the captured image 438, theremote computing device 434 performs the analysis of the captured image438 and generates a command 437 to adjust the operation of slave device433. The command 437 is then communicated to slave device 433 viacommunication medium. Slave device 433 then adjusts operation ascommanded such that more desirable samples are output from slave device433. This scenario does not require any local knowledge or processingcapability to be present on the slave device 433, because all thenecessary analysis is performed by the remote computing device 434.Likewise, this scenario does not require any local knowledge orprocessing capability to be present on the inspection device 432,because all the necessary analysis is performed by the remote computingdevice 434. Both slave device 433 and inspection device 432 can operateas “dumb” terminals that simply adjust operation based on receivedcommands from the remote computing device 434. This solution may be veryvaluable as it does not require any devices through which the samplepasses to have local processing capability and knowledge, which in turnreduces the cost of the overall system.

In another example, captured image 438 is not communicated from theinspection device 432 to the remote computing device 434, but ratherinspection data 435 is communicated from the inspection device 432 toremote computing device 434. In this scenario, the inspection device 432captures an image of the sample and from the captured image determinesquality characteristic(s) of the sample. The inspection data (groupingof quality characteristics) is then communicated to the remote computingdevice 434. In response to receiving the inspection data, the remotecomputing device 434 generates one or more commands to adjust one ormore slave devices. In this example, the inspection device 432 requiresthe processing capability to determine the quality characteristics, butdoes not require the capability to determine commands for adjustingslave devices.

While the scenario illustrated in FIG. 16 a great improvement, a remotecomputing device can be used in an even more beneficial way. Thisimproved use is illustrated in FIG. 17.

FIG. 17 illustrates an inspection data control system of multipleprocessing lines using a remote computing device. Each processing line441-446 includes at least one inspection device that is capable ofcapturing an image and sending the capture image and/or inspection databased on the captured image to a remote computing device 440.

The in response to receiving only the captured image data 448, theremote computing device 440 determines quality characteristics and thenbased on those quality characteristics (“inspection data”) the remotecomputing device 440 generates command(s) to adjust the operation ofslave device(s) in the processing line from which the image wascaptured.

In response to receiving the inspection data 447, the remote computingdevice 440 generates command(s) to adjust the operation of slavedevice(s) in the processing line from which the image was captured.

This scenario also reduces the complication of managing multiple sampleprocessing lines. A single remote computing device 440 could receiveinspection data from various inspection devices included in variousprocessing lines 441-446. In this fashion, the single remote computingdevice 440 could monitor and adjust all the various slave devices inprocessing lines 441-446. This scenario can also provide for advancedlearning because all inspection data from all processing lines 441-446are received by the remote computing device 440, which in turn allowsfor improved artificial intelligence learning by way of access to largersets of relevant inspection data.

This scenario also allows for real-time monitoring and adjusting ofmultiple processing lines located at various locations around the world.

FIG. 24 is a flowchart 300 of an inspection data communication system.In step 301, an image of a sample is captured by an inspection device asthe sample travels along a processing line. In step 302, the capturedimage is processed with respect to quality characteristic(s) andinspection data is generated. In step 303, the inspection data iscommunicated from the inspection device to another device located alongthe sample processing line. In step 304, the device receives theinspection data and in response adjusts the operation of the devicebased at least in part on the inspection data received.

FIG. 25 is a flowchart 400 of a command communication system. In step401, an image of a sample is captured by an inspection device as thesample travels along a processing line. In step 402, the captured imageis processed with respect to quality characteristic(s) and inspectiondata is generated. In step 403, a command is generated based at least inpart on the inspection data. In step 404, the command is thencommunicated from the inspection device to another device located alongthe sample processing line. In step 405, the device receives the commandand in response adjusts the operation of the device based at least inpart on the command received.

FIG. 26 is a flowchart 500 of an inspection data control system using aremote computing device. In step 501, an image of a sample is capturedby the inspection device as the sample travels along a processing line.In step 502, the captured image is communicated to the remote computingdevice. In step 503, in response to receiving the captured image, theremote computing device determines quality characteristic(s) andgenerates inspection data. In step 504, the remote computing deviceprocesses the inspection data and generates a command. In step 505, thecommand is communicated from the remote computing device to a devicelocated along the sample processing line. In step 506, the devicereceives the command and in response adjusts the operation of the devicebased at least in part on the command received.

FIG. 27 is a flowchart 600 of an inspection data control system using aremote computing device. In step 601, an image of a sample is capturedby the inspection device as the sample travels along the processingline. In step 602, the captured image is processed with respect toquality characteristic(s) and inspection data is generated. In step 603,the inspection data is communicated from the inspection device to aremote computing device and in response to receiving the inspectiondata, the remote computing device processes the inspection data andgenerates a command. In step 604, the command is communicated from theremote computing device to another device located along the sampleprocessing line. In step 605, the device receives the command and inresponse adjusts the operation of the device based at least in part onthe command received.

Distributed Ledger

A distributed ledger, sometimes referred to as “Blockchain”, is a sharedpublic ledger on which a system relies. The distributed ledger has alinked list data structure, with each block containing a hash of theprevious block. Each block is formed by a proof-of-work algorithm,through which consensus of this distributed ledger could be obtained viathe longest possible chain. The distributed ledger provides the basisfor a distributed system that does not require trust between varioususers and is extendable in many ways through modifications of theparameters of the chain.

A block is an aggregated set of data. Data are collected and processedto fit in a block through a process called mining. Each block could beidentified using a cryptographic hash (also known as a digitalfingerprint). The formed block will contain a hash of the previousblock, so that blocks can form a chain from the first block ever (knownas the Genesis Block) to the newly formed block. In this way, all thedata could be connected via a linked list structure.

Data are contained inside blocks as well as an arbitrary integer (callednounce) that is necessary for producing the proof-of-work. In theexample of Bitcoin, a block contains a header and relevant transactiondata. A merkle tree of transactions is created and the hash of the rootis included in the header. A merkle tree is a full binary tree of a hashvalues. At the bottom level of the tree, each transaction has a nodecontaining its hash value. The tree is constructed in a way such thatthe parent node has a value of the hash of the data contained in itschildren concatenating together. The merkle tree data structure allowsfast validation by constructing a merkle tree path from the bottom levelof the tree up to the root node. Since each bitcoin transaction outputcan be spent only once, as long as the output is spent, it could beerased out of the tree structure using some pruning algorithms. In thisway, disk usage is reduced while the validation functions are preserved.

Various blocks in the blockchain are connected to specific other blocksin the blockchain. In one example, each block contains a hash of itsprevious block. In bitcoin blockchain for example, the block header hasa field for previous block hash. Therefore all blocks will contain areference of its previous block thereby enabling the chain to be buildup to the genesis block.

A fork on the block chain may occur. A fork in the block chain occursdue to two blocks computed at a very short time interval. The subsequentblocks may build upon both blocks and both of the chains remain valid.In subsequent process of mining, one fork would be longer than the otherfork, in this case, the longer chain would be accepted by the networkand the short would not be used unless its length exceeds the longerchain in the future.

Many distributed ledgers, such as Bitcoin blockchain, use aproof-of-work algorithm for reaching a consensus. The cryptographic hashfunction of each block must be smaller than a specific value in order tobe considered value. A nonce is therefore included in the block for thisfeature. By using the proof-of-work method, in order to change the datain one block, all successors of that block must be re-written and a hugeamount of calculation is necessary. In addition, the longest chain wouldbe accepted by the network whereas the shorter ones would be discardedat the situation of branches of the chain. This makes the data in blockspractically unmodifiable. Further, the more blocks that are built uponthe block in which the data is contained, more processing is required tooverwrite the data.

However, the blockchain may use other methods of consensus. For example,a blockchain may use Scrypt for proof-of-work algorithm instead of hashfunctions. In addition, the blockchain could be extended for scientificcomputation where a correct solution to a certain problem could act avalidation method. In this way, the computation power may be used tohelp solving scientific problems and contribute to scientificresearches.

In a distributed ledger, each user running a full node on the computerwill download a full copy of the whole blockchain, which will includedata of all events, such as transactions, recorded on the blockchain.After that, each node can run independently to process any incomingevents, such as transactions, and propagate the event further. The nodecan also contribute to the establishment of the consensus by mining toinclude event data in a block and then to find a proof-of-work for theblock. There is not a central node processing the data and distributingthe data, rather every node can run independently and broadcast any workthat is proved. This model of distributed computation could be extendedto many other services such as Domain Name Server.

Quality Inspection Data Distributed Ledger

While distributed ledgers have been utilized to perform financialtransactions, distributed ledgers have not been utilized to performrecordation and distribution of quality inspection data.

Quality inspection data is measured and recorded for many differentitems around the world, such as pharmaceuticals, mechanical hardware,agricultural foods and many, many more.

One challenge is the acquisition of quality inspection data. Forexample, some quality inspection data is generated by humans reviewingitems manually. This process is prone to large variances depending onthe human conducting the inspection as well as the state of the humanwhen the inspection is conducted. In other examples, computer automationis used to help, or entirely, acquire the quality inspection data asdisclosed above.

Regardless of the method in which the quality inspection data isacquired, a second challenge is the integrity of the quality data thatis reported to interested parties, such as owners, purchasers,manufacturers, etc. For example, in the almond industry many purchasersare weary of the quality data that is alleged by various almondproviders. The uncertainty spawns from various sources. First, was thequality inspection data reliable? Second, was the quality inspectiondata accurately managed and is it accurately aligned with the productbeing offered? Third, was the quality inspection data intentionallytampered with to increase the market price of the product being sold?Fourth, difficulty to gain access to the data regardless of the threeconcerns listed above. All of these uncertainties lead to time and costinefficiencies. A trust worthy, reliable and cost efficient solution isprovided herein.

Regarding the reliability of the quality inspection data, as discussedabove, an automated system such as the in-flight optical inspector canbe used to acquire reliable and consistent quality inspection data.

Regarding the management, possible tampering, and access to the acquiredquality inspection data a new quality inspection data distributed ledgeris disclosed. This quality inspection data distributed ledger does notperform financial transactions. Rather, the quality inspection datadistributed ledger validates the source, timing, product association,and integrity of the quality inspection data.

FIG. 28 is a diagram of a quality inspection data distributed ledgerflowchart 620. In step 621, one or more samples to be inspected arecollected. In step 622, the one or more samples are assigned a uniqueidentification code. In one example, the identification code is affixedto a container containing the one or more samples. In another example,the code is affixed to the one or more samples themselves. The code maybe communicated by use of a Quick Response (QR) code, a bar code,printed text, Radio Frequency Identification (RFID) tag, human manualentry, a Near Field Communication (NFC) signal, a token, or any othermethod of communication known to one of skill in the art.

Once the identification code has been assigned to the one or moresamples, the one or more samples are inspected in step 623. Thisinspection can be performed by any possible method. In one example, theinspection can be performed by human inspection. In another example, theinspection can be performed by an automated inspection. In yet anotherexample, the inspection can be performed by an in-flight 3D inspector asdisclosed above.

Upon completion of the inspection of the one or more samples, in step624 the resulting inspection data and the identification code arewritten into a new quality inspection data block. An example of aquality inspection data block is illustrated in FIG. 29. The exemplaryquality inspection data block of FIG. 29 may include the following datafields: an inspection entity that conducted the inspection, inspectionlocation where the inspection was conducted, the sensor identificationnumber that identifies the sensor or inspection device that performedthe inspection, the lot number of the one or more samples, the totalweight of the lot of samples, analysis completion timestamp indicatingwhen the inspection was performed or completed, the amount of productanalyzed (for example in weight or quantity), the moisture content ofthe samples, the kernel size of the samples, the uniformity ratio of thesamples (average, median, variance, etc.), the percentage or number of“good” samples or samples that pass all required characteristics, thepercentage or number of dissimilar samples, the percentage or number ofchipped and scratched samples, the percentage or number of samplesincluding another type of defect, the percentage or number of samplesthat have serious damage, and the quality grade of the one or moresamples, such as U.S. Extra #1 grade.

The exemplary quality inspection data block of FIG. 29 may also includethe following data fields: a color value, a microtoxin value(milligram/kg, microgram/kg, Parts Per Million, Parts Per Billion . . .), a temperature value, an acidity (pH) value, a pressure value (kPA,PSI . . . ), a volume per unit time (cubic meters per second), an amountof discolored product (number of percentage), an amount of brokenproduct (number or percentage), an amount of rancid product (number orpercentage), an amount of moldy product (number of percentage), anamount of immature product (number or percentage), an amount of unripeproduct (number or percentage), or an amount of rotten soft product(number or percentage).

The inspection data fields listed above are only provided to beexemplary. One skilled in the art will appreciate that any othercharacteristic determined during inspection can be included in thequality inspection data block. Likewise, any of the inspection datafields listed can be omitted from the quality inspection data block aswell. A list of other possible inspection devices is listed below.

Optical sensors

Moisture sensors

Microtoxin sensors

Thermometer sensors

Acidity (pH) sensors

Microwave sensors

Pressure sensors

Level sensors

Ultrasonic sensors

Flow sensors

Viscosity sensors

Conductance/Impedance sensors

Electronic Nose (sniffing) sensors

X-ray sensors

Multi Spectral (visual/non visual) sensors

Weight sensors

Refractometers sensors

Tenderometer sensors

Firmness sensors

Hardness sensors

Proximity sensor

The quality inspection data block may also include hash information. Thequality inspection data block may include any of the following hashinformation: Hash of the quality inspection data block itself, hash ofthe previous quality inspection data block, hash of the next qualityinspection data block, or a Merkle root.

In the example where an inspector with computational capabilitiesperforms the inspection, the inspector may create the quality inspectiondata block itself upon completion of the inspection process. In theexample where the inspector does not have computational capabilities,the data collected by the inspector can be manually entered intocomputationally capable device to create the quality inspection datablock.

In step 625, after the quality inspection data block is created, thequality inspection data block is added to the distributed ledger. In oneexample, the distributed ledger is referred to as a blockchain. In theexample where an inspector includes networking capabilities, theinspector can add the new quality inspection data block to thedistributed ledger via a network. Once the quality inspection data blockhas been added to the distributed ledger, the quality inspection datablock is available for viewing by anyone on the network and cannoteasily be changed.

This quality inspection data distributed ledger will solve the problemscurrently facing the consumers of quality inspection data. Consumers ofquality inspection data will now have a single source of trustworthyquality inspection data that is easy to access.

Adaptable Inspection Unit & Adaptable Sorter Unit

Processing lines are widely used to inspect and sort large quantities ofa specific item. For example, processing lines are used to inspect andsort eatable items such as fruits and nuts. Alternatively, processinglines are used to inspect and sort pharmaceutical pills. A popularexample of a simple processing line is a conveyor processing line whereitems are propelled through the processing line via a conveyor belt thatis wound around the conveyor head pulley and tail pulley. Other examplesof processing lines include, but are not limited to, a flume, a rollerbelt, a shaker (conventional and linear motion), a slide, a chute, aconveyor tube, a bucket elevator, and a screw conveyor. To date, basicprocessing lines, such as conveyors, have not been adaptable to workwith any improved processing devices.

Recent improvements in the area of sample inspection and sorting, as aredisclosed above in the present application, have provided tremendousimprovements in the areas of reliability of quality inspection data,high accuracy quality inspection data, low cost of quality inspectiondata, as well as intelligent and automatic dynamic control of sortingdevices. Currently, owners and operators of legacy simple processinglines, such as conveyors and chutes, cannot attain these improvementswithout upgrading their entire processing line without suffering largecosts, new process planning and time delays. A solution is needed toprovide these improved inspection and sorting technologies in a way thatcan be easily and cost effectively adapted to a legacy simple processingline. A solution to this need is provided herein.

FIG. 30 is a diagram of a conveyor for manual inspection or sorting.This system of using a conveyor for manual inspection and sorting isused widely around the world. In operation, sample 701 is caused tobecome in contact with conveyor 700. Upon contact, sample 701 is movedvia a rotating conveyor belt of conveyor 700. A conveyor belt usuallyrotates the conveyor belt about two or more pulleys. The frictionbetween the sample and the rotating conveyor belt causes the sample tobe move along the direction of the conveyor belt movement. A human islocated proximate to the conveyor where the human can see the sample asit travels past the human. In the event that the human needs to moreclearly see the sample, the human can pick up and more carefully inspectthe sample. The human has the responsibility of determining the qualityof the sample. Further, the human has the responsibility to determinehow the sample should be sorted based on the determined quality. Forexample, the human may determine that the sample is of a quality thatshould be discarded. In which case, the human would manually with thehumans hand, or with a tool manually manipulated by the human, cause thesample to be removed from the processing line and sent to a group ofdiscarded samples. In another example, the human may determine that thesample is of a mediocre quality that should not be discarded, but alsoshould not be grouped with top quality samples. In which case, the humanwould manually cause the sample to be moved to a group of mediocresamples. In yet another example, the human may determine that the sampleis of top quality. In which case, the human would not cause the sampleto be moved at all, but would rather allow the sample to continuethrough the processing line to be grouped with all other top qualitysamples. The samples may be fruits, nuts, pills or any other type ofitem for which quality control is required.

This method requires a large amount of human attention and time.Moreover, this method of manual inspection and sorting is prone to humanerror, low quality accuracy, and low repeatability (inconsistentresults).

FIG. 31 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor. Conveyor 710 is the same as conveyor 700,except in that adaptable inspection unit 712 has been physically mountedto conveyor 700. Similar to FIG. 30, in operation, sample 711 is causedto become in contact with conveyor 710. Upon contact, sample 711 ismoved via a rotating conveyor belt of conveyor 710. The friction betweenthe sample and the rotating conveyor belt causes the sample to be movealong the direction of the conveyor belt movement.

The adaptable inspection unit 712 is attached to the conveyor 710 viaone or more mounting brackets 713. One skilled in the art will readilyrealize that a various number of brackets and various styles of bracketscan be used to mount the adaptable inspection unit 712 to conveyor 710.Mounting Bracket 713 can attach to either the adaptable inspection unit712 or the conveyor 710 using various items, such as bolts, screws,pins, locks, clamps, welds (metals or thermoplastics), adhesive, slots,magnets, rails, gravity or friction.

The adaptable inspection unit 712 includes an attachment mechanism, aninspection sensor device (optical receiver), a data port and a powerport. The data port and the power port may be combined into a singlephysical port that connects to a single cable 714 that includes bothpower conductors and data conductors. Alternatively, the adaptableinspection unit 712 may include a data port that is separate from thepower port. Further, the adaptable inspection unit 712 may include anantenna connectable data port that connects to an antenna 715 so toallow for wireless communication. FIG. 31 does not illustrate theinspection sensor device. FIG. 39 illustrates a block diagram of anadaptable inspection unit 790 that includes an attachment mechanism 791,an inspection sensor device 792, a data port 793, and a power port 794.

In operation, the conveyor 710 causes the sample 711 to travel under theadaptable inspection unit 712. While the sample is in view of theinspection sensor device that is included in the adaptable inspectionunit 712 one or more images of the sample are captured and stored in amemory device. The memory device may be included in the adaptableinspection unit 712 or may be included in a device that communicateswith the adaptable inspection unit 712 via the data port (wired orwireless). The captured sensor data (e.g. images) are then processed bya processor executing a quality inspection algorithm. In one example,the adaptable inspection unit 712 includes the 3D inspector described indetail above. In another example, a 3D image of the sample is generatedbased on the one or more images captured by the adaptable inspectionunit 712. In yet another example, the captured 2D image is used toperform the inspection. The 3D or 2D image(s) are used to determine aquality characteristic of the sample. In one example, the qualitycharacteristic is generated by the adaptable inspection unit 712 andoutput via the data port. In another example, the one or more capturedimages are output from the adaptable inspection unit 712 to anotherdevice that determines the quality characteristics of the sample.Adaptable inspection unit 712 provides improve quality inspectioncompared to unreliable inspection by human eyes without the cost ofreplacing an entire processing line. Moreover, adaptable inspection unit712 is able to inspect many more samples per unit time than could beinspected by a human.

In the example of FIG. 31, all samples are directed toward the samelocation regardless of measured quality because there is no sortingfunctionality attached to the conveyor 710.

FIG. 32 is a diagram of a conveyor with an adaptable sorting unitattached to the conveyor. Conveyor 720 is the same as conveyor 700,except in that adaptable sorter unit 722 has been physically mounted toconveyor 720. Similar to FIG. 30, in operation, sample 721 is caused tobecome in contact with conveyor 720. Upon contact, sample 721 is movedvia a rotating conveyor belt of conveyor 720. The friction between thesample and the rotating conveyor belt causes the sample to be move alongthe direction of the conveyor belt movement.

The adaptable sorter unit 722 is attached to the conveyor 720 via one ormore mounting brackets 723. One skilled in the art will readily realizethat a various number of brackets and various styles of brackets can beused to mount the adaptable sorter unit 722 to conveyor 720. MountingBracket 723 can attach to either the adaptable sorter unit 722 or theconveyor 720 using various items, such as bolts, screws, pins, locks,clamps, welds (metals or thermoplastics), adhesive, slots, magnets,rails, gravity or friction.

The adaptable sorter unit 722 includes an attachment mechanism, asorting device is capable of deflecting a sample, a data port and apower port. The data port and the power port may be combined into asingle physical port that connects to a single cable 724 that includesboth power conductors and data conductors. Alternatively, the adaptablesorter unit 722 may include a data port that is separate from the powerport. Further, the adaptable sorter unit 722 may include an antennaconnectable data port that connects to an antenna 725 so to allow forwireless communication. FIG. 32 does not illustrate the sorting device.FIG. 40 illustrates a block diagram of an adaptable sorter unit 800 thatincludes an attachment mechanism 801, a sorting device 802, a data port803, and a power port 804.

In operation, the conveyor 720 causes the sample 721 to travel under theadaptable sorter unit 722. While the sample is in reach of the sortingdevice that is included in the adaptable sorter unit 722 the sample issorted as instructed. In one example, the sorting instruction isreceived via the data port and stored in a memory included in theadaptable sorting unit 722. In another example, quality characteristicdata is received via the data port and in response the adaptable sorterunit 722 generates the sorting instruction. In yet another example, theinformation received via the data port is a percentage of samples to bedeflected. Communication with the adaptable sorter unit 722 may beperformed via the data port (wired or wireless). The sorting device maybe by a vacuum system, a mechanical pedal system, an air jet system, ora mechanical gate. The adaptable sorting unit 722 performs automatedsorting so that high quality samples are automatically separated fromlow quality samples.

Adaptable sorter unit 722 provides improve sorting compared tounreliable sorting by human hands without the cost of replacing anentire processing line. Moreover, adaptable sorter unit 722 is able tosort many more samples per unit time than could be sorted by a human.

FIG. 33 is a diagram of a conveyor with an adaptable inspection unitattached to the ceiling above the conveyor. Conveyor 730 is the same asconveyor 700, except in that adaptable inspection unit 732 has beenphysically mounted to the ceiling above conveyor 730. Similar to FIG.30, in operation, sample 731 is caused to become in contact withconveyor 730. Upon contact, sample 731 is moved via a rotating conveyorbelt of conveyor 730. The friction between the sample and the rotatingconveyor belt causes the sample to be move along the direction of theconveyor belt movement.

The adaptable inspection unit 732 is attached to the ceiling aboveconveyor 730 via one or more mounting brackets 733. One skilled in theart will readily realize that a various number of brackets and variousstyles of brackets can be used to mount the adaptable inspection unit732 to the ceiling above conveyor 730. Mounting Bracket 733 can attachto either the adaptable inspection unit 712 or the ceiling aboveconveyor 730 using various items, such as bolts, screws, pins, locks,clamps, welds (metals or thermoplastics), adhesive, slots, magnets,rails, gravity or friction.

The adaptable inspection unit 732 includes an attachment mechanism, aninspection sensor device (optical receiver), a data port and a powerport. The data port and the power port may be combined into a singlephysical port that connects to a single cable 734 that includes bothpower conductors and data conductors. Alternatively, the adaptableinspection unit 732 may include a data port that is separate from thepower port. Further, the adaptable inspection unit 732 may include anantenna connectable data port that connects to an antenna 735 so toallow for wireless communication. FIG. 33 does not illustrate theinspection sensor device. FIG. 39 illustrates a block diagram of anadaptable inspection unit 790 that includes an attachment mechanism 791,an inspection sensor device 792, a data port 793, and a power port 794.

In operation, the conveyor 730 causes the sample 731 to travel under theadaptable inspection unit 732. While the sample is in view, or reach, ofthe inspection sensor device that is included in the adaptableinspection unit 732 one or more characteristics and/or images of thesample are captured and stored in a memory device. The memory device maybe included in the adaptable inspection unit 732 or may be included in adevice that communicates with the adaptable inspection unit 732 via thedata port (wired or wireless). The captured characteristics and/orimage(s) are then processed by a processor executing a qualityinspection algorithm. In one example, the adaptable inspection unit 732includes the 3D inspector described in detail above. In another example,a 3D image of the sample is generated based on the one or more imagescaptured by the adaptable inspection unit 732. In yet another example,the captured 2D image is used to perform the inspection. The 3D and/or2D image(s) are used to determine a quality characteristic of thesample. In one example, the quality characteristic is generated by theadaptable inspection unit 732 and output via the data port. In anotherexample, the one or more captured images are output from the adaptableinspection unit 732 to another device that determines the qualitycharacteristics of the sample. Adaptable inspection unit 732 providesimprove quality inspection compared to unreliable inspection by humaneyes without the cost of replacing an entire processing line. Moreover,adaptable inspection unit 732 is able to inspect many more samples perunit time than could be inspected by a human.

In the example of FIG. 33, all samples are directed toward the samelocation regardless of measured quality because there is no sortingfunctionality attached to the conveyor 730.

FIG. 34 is a diagram of a conveyor with an adaptable sorting unitattached to a ceiling above the conveyor. Conveyor 740 is the same asconveyor 700, except in that adaptable sorter unit 742 has beenphysically mounted to the ceiling above conveyor 740. Similar to FIG.30, in operation, sample 741 is caused to become in contact withconveyor 740. Upon contact, sample 741 is moved via a rotating conveyorbelt of conveyor 740. The friction between the sample and the rotatingconveyor belt causes the sample to be move along the direction of theconveyor belt movement.

The adaptable sorter unit 742 is attached to the ceiling above conveyor740 via one or more mounting brackets 743. One skilled in the art willreadily realize that a various number of brackets and various styles ofbrackets can be used to mount the adaptable sorter unit 742 to theceiling above conveyor 740. Mounting Bracket 743 can attach to eitherthe adaptable sorter unit 742 or the ceiling above conveyor 740 usingvarious items, such as bolts, screws, pins, locks, clamps, welds (metalsor thermoplastics), adhesive, slots, magnets, rails, gravity orfriction.

The adaptable sorter unit 742 includes an attachment mechanism, asorting device is capable of deflecting a sample, a data port and apower port. The data port and the power port may be combined into asingle physical port that connects to a single cable 744 that includesboth power conductors and data conductors. Alternatively, the adaptablesorter unit 742 may include a data port that is separate from the powerport. Further, the adaptable sorter unit 742 may include an antennaconnectable data port that connects to an antenna 745 so to allow forwireless communication. FIG. 34 does not illustrate the sorting device.FIG. 40 illustrates a block diagram of an adaptable sorter unit 800 thatincludes an attachment mechanism 801, a sorting device 802, a data port803, and a power port 804.

In operation, the conveyor 740 causes the sample 741 to travel under theadaptable sorter unit 742. While the sample is in reach of the sortingdevice that is included in the adaptable sorter unit 742 the sample issorted as instructed. In one example, the sorting instruction isreceived via the data port and stored in a memory included in theadaptable sorting unit 742. In another example, quality characteristicdata is received via the data port and in response the adaptable sorterunit 742 generates the sorting instruction. In yet another example, theinformation received via the data port is a percentage of samples to bedeflected. Communication with the adaptable sorter unit 742 may beperformed via the data port (wired or wireless). The sorting device maybe a vacuum system, a mechanical pedal system, an air jet system, or amechanical gate. The adaptable sorting unit 742 performs automatedsorting so that high quality samples are automatically separated fromlow quality samples.

Adaptable sorter unit 742 provides improve sorting compared tounreliable sorting by human hands without the cost of replacing anentire processing line. Moreover, adaptable sorter unit 742 is able tosort many more samples per unit time than could be sorted by a human.

FIG. 35 is a diagram of a conveyor with an adaptable inspection unitattached to a mounting stand. Conveyor 750 is the same as conveyor 700,except in that adaptable inspection unit 752 has been physically mountedto a mounting stand 756 located next to conveyor 750. Similar to FIG.30, in operation, sample 751 is caused to become in contact withconveyor 750. Upon contact, sample 751 is moved via a rotating conveyorbelt of conveyor 750. The friction between the sample and the rotatingconveyor belt causes the sample to be move along the direction of theconveyor belt movement.

The adaptable inspection unit 752 is attached to the mounting stand 756,located next to conveyor 750, via one or more mounting brackets 753. Oneskilled in the art will readily realize that a various number ofbrackets and various styles of brackets can be used to mount theadaptable inspection unit 752 to the mounting stand 756. MountingBracket 753 can attach to either the adaptable inspection unit 752 orthe mounting stand 756 using various items, such as bolts, screws, pins,locks, clamps, welds (metals or thermoplastics), adhesive, slots,magnets, rails, gravity or friction.

The adaptable inspection unit 752 includes an attachment mechanism, aninspection sensor device (e.g. optical receiver), a data port and apower port. The data port and the power port may be combined into asingle physical port that connects to a single cable 754 that includesboth power conductors and data conductors. Alternatively, the adaptableinspection unit 752 may include a data port that is separate from thepower port. Further, the adaptable inspection unit 752 may include anantenna connectable data port that connects to an antenna 755 so toallow for wireless communication. FIG. 35 does not illustrate theinspection sensor device. FIG. 39 illustrates a block diagram of anadaptable inspection unit 790 that includes an attachment mechanism 791,an inspection sensor device 792, a data port 793, and a power port 794.

In operation, the conveyor 750 causes the sample 751 to travel under theadaptable inspection unit 752. While the sample is in view, or reach, ofthe inspection sensor device that is included in the adaptableinspection unit 752 one or more characteristics and/or images of thesample are captured and stored in a memory device. The memory device maybe included in the adaptable inspection unit 752 or may be included in adevice that communicates with the adaptable inspection unit 752 via thedata port (wired or wireless). The captured characteristics and/orimage(s) are then processed by a processor executing a qualityinspection algorithm. In one example, the adaptable inspection unit 752includes the 3D inspector described in detail above. In another example,a 3D image of the sample is generated based on the one or more imagescaptured by the adaptable inspection unit 752. In yet another example,the captured 2D image is used to perform the inspection. The 3D and/or2D image(s) are used to determine a quality characteristic of thesample. In one example, the quality characteristic is generated by theadaptable inspection unit 752 and output via the data port. In anotherexample, the one or more captured images are output from the adaptableinspection unit 752 to another device that determines the qualitycharacteristics of the sample. Adaptable inspection unit 752 providesimprove quality inspection compared to unreliable inspection by humaneyes without the cost of replacing an entire processing line. Moreover,adaptable inspection unit 752 is able to inspect many more samples perunit time than could be inspected by a human.

In the example of FIG. 35, all samples are directed toward the samelocation regardless of measured quality because there is no sortingfunctionality attached to the conveyor 750.

FIG. 36 is a diagram of a conveyor with an adaptable sorting unitattached to a mounting stand. Conveyor 760 is the same as conveyor 700,except in that adaptable sorter unit 762 has been physically mounted toa mounting stand 766 located next to conveyor 760. Similar to FIG. 30,in operation, sample 761 is caused to become in contact with conveyor760. Upon contact, sample 761 is moved via a rotating conveyor belt ofconveyor 760. The friction between the sample and the rotating conveyorbelt causes the sample to be move along the direction of the conveyorbelt movement.

The adaptable sorter unit 762 is attached to the mounting stand 766,located next to conveyor 760, via one or more mounting brackets 763. Oneskilled in the art will readily realize that a various number ofbrackets and various styles of brackets can be used to mount theadaptable sorter unit 762 to the mounting stand 766. Mounting Bracket763 can attach to either the adaptable sorter unit 762 or the mountingstand 766 using various items, such as bolts, screws, pins, locks,clamps, welds (metals or thermoplastics), adhesive, slots, magnets,rails, gravity or friction.

The adaptable sorter unit 762 includes an attachment mechanism, asorting device is capable of deflecting a sample, a data port and apower port. The data port and the power port may be combined into asingle physical port that connects to a single cable 764 that includesboth power conductors and data conductors. Alternatively, the adaptablesorter unit 762 may include a data port that is separate from the powerport. Further, the adaptable sorter unit 762 may include an antennaconnectable data port that connects to an antenna 765 so to allow forwireless communication. FIG. 36 does not illustrate the sorting device.FIG. 40 illustrates a block diagram of an adaptable sorter unit 800 thatincludes an attachment mechanism 801, a sorting device 802, a data port803, and a power port 804.

In operation, the conveyor 760 causes the sample 761 to travel under theadaptable sorter unit 762. While the sample is in reach of the sortingdevice that is included in the adaptable sorter unit 762 the sample issorted as instructed. In one example, the sorting instruction isreceived via the data port and stored in a memory included in theadaptable sorting unit 762. In another example, quality characteristicdata is received via the data port and in response the adaptable sorterunit 762 generates the sorting instruction. In yet another example, theinformation received via the data port is a percentage of samples to bedeflected. Communication with the adaptable sorter unit 762 may beperformed via the data port (wired or wireless). The sorting device maybe a vacuum system, a mechanical pedal system, an air jet system, or amechanical gate. The adaptable sorting unit 762 performs automatedsorting so that high quality samples are automatically separated fromlow quality samples.

Adaptable sorter unit 762 provides improve sorting compared tounreliable sorting by human hands without the cost of replacing anentire processing line. Moreover, adaptable sorter unit 762 is able tosort many more samples per unit time than could be sorted by a human.

FIG. 37 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor sidewall. The adaptable inspection unit can beattached permanently or temporarily to the conveyor sidewall. Conveyor780 includes one or more sidewalls 781 and a belt that rotates about twoor more pulleys. The sidewall 781 is included in the conveyor 780 so toprevent samples from fall off the sides of the conveyor 780. Thesidewall 781 of the conveyor 780 can be used to support the adaptableinspection unit 782. Although not shown in FIG. 37, the sidewall 781 canalso be used to mount an adaptable sorter unit.

The adaptable inspection unit 782 (or an adaptable sorter unit) can beattached using many different mechanisms. Some of these mechanisms arelisted on FIG. 37. These attachment mechanisms include welding theadaptable inspection unit 782 to the conveyor sidewall 781, gluing theadaptable inspection unit 782 to the conveyor sidewall 781, clamping theadaptable inspection unit 782 to the conveyor sidewall 781, magneticallyattracting the adaptable inspection unit 782 to the conveyor sidewall781, latching the adaptable inspection unit 782 to the conveyor sidewall781, locking the adaptable inspection unit 782 to the conveyor sidewall781, location pinning the adaptable inspection unit 782 to the conveyorsidewall 781, rail mating the adaptable inspection unit 782 to theconveyor sidewall 781, slide fitting the adaptable inspection unit 782to the conveyor sidewall 781, lock pinning the adaptable inspection unit782 to the conveyor sidewall 781, or using gravity and friction to“attach” the adaptable inspection unit 782 to the conveyor sidewall 781.

The adaptable inspection unit 782 includes an attachment mechanism, aninspection sensor device (e.g. an optical receiver), a data port and apower port. The data port and the power port may be combined into asingle physical port that connects to a single cable 784 that includesboth power conductors and data conductors. Alternatively, the adaptableinspection unit 782 may include a data port that is separate from thepower port. Further, the adaptable inspection unit 782 may include anantenna connectable data port that connects to an antenna 785 so toallow for wireless communication. FIG. 37 does not illustrate theinspection sensor device. FIG. 39 illustrates a block diagram of anadaptable inspection unit 790 that includes an attachment mechanism 791,an inspection sensor device 792, a data port 793, and a power port 794.

In operation, the conveyor 780 causes the sample 781 to travel under theadaptable inspection unit 782. While the sample is in view, or reach, ofthe inspection sensor device that is included in the adaptableinspection unit 782 one or more characteristics and/or images of thesample are captured and stored in a memory device. The memory device maybe included in the adaptable inspection unit 782 or may be included in adevice that communicates with the adaptable inspection unit 782 via thedata port (wired or wireless). The captured characteristics and/orimage(s) are then processed by a processor executing a qualityinspection algorithm. In one example, the adaptable inspection unit 782includes the 3D inspector described in detail above. In another example,a 3D image of the sample is generated based on the one or more imagescaptured by the adaptable inspection unit 782. In yet another example,the captured 2D image is used to perform the inspection. The 3D and/or2D image(s) are used to determine a quality characteristic of thesample. In one example, the quality characteristic is generated by theadaptable inspection unit 782 and output via the data port. In anotherexample, the one or more captured images are output from the adaptableinspection unit 782 to another device that determines the qualitycharacteristics of the sample. Adaptable inspection unit 782 providesimprove quality inspection compared to unreliable inspection by humaneyes without the cost of replacing an entire processing line. Moreover,adaptable inspection unit 782 is able to inspect many more samples perunit time than could be inspected by a human.

In the example of FIG. 37, all samples are directed toward the samelocation regardless of measured quality because there is no sortingfunctionality attached to the conveyor 780. However, an adaptable sorerunit as described above could be placed further down the conveyor 780 toprovide sorting functionality as well as inspection functionality.

FIG. 38 is a diagram of a conveyor with an adaptable inspection unitattached to the conveyor and an adaptable sorting unit attached to theconveyor. As discussed above an adaptable inspection unit 772 and anadaptable sorter unit 776 can be mounted or positioned near an existingprocessing line. With these solutions, both an adaptable inspection unit772 and an adaptable sorter unit 776 can be added to an existingprocessing line to allow for both automated quality inspection ofsamples as well as automated sorting of samples, without the cost ofreplacing the entire processing line. As discussed above, the adaptableinspection unit 772 and the adaptable sorter unit 776 can communicatewith each other in various methods to achieve the desired inspection andsorting functions. Further, the adaptable inspection unit 772 and theadaptable sorter unit 776 can communicate with each in addition to aseparate computing device, such as a network server to achieve thedesired inspection and sorting functions. The drawings and relateddisclosure regarding FIGS. 14-27 illustrate and describe multiplemethods in which the adaptable inspection unit 772 and the adaptablesorter unit 776 can communicate with each other in various methods toachieve the desired inspection and sorting functions (the adaptableinspection unit 772 performing the functions of the inspection deviceand the adaptable sorter unit 776 performing the functions of a slavedevice).

FIG. 39 is a block diagram of an adaptable inspection unit. Theadaptable inspection unit 790 that includes an attachment mechanism 791,an inspection sensor device (optical receiver) 792, a data port 793, anda power port 794. The adaptable inspection unit 790 may also include amemory unit and a processor capable of controlling the inspection sensordevice and writing information transmitted via the data port.

FIG. 40 is a block diagram of an adaptable sorter unit. The adaptablesorter unit 800 that includes an attachment mechanism 801, a sortingdevice 802, a data port 803, and a power port 804. The adaptable sorterunit 800 may also include a memory and a processor capable of readinginformation received via the data port and controlling the sortingdevice.

FIG. 41 is a flowchart 900 illustrating the operations performed by anadaptable inspection unit. In step 901, an attachment mechanism isconnected to the adaptable inspection unit. In step 902, the attachmentmechanism is connected to the existing processing line. This can be aconnection directly to the existing processing line or to an object nearthe existing processing line, such as a wall, ceiling, mounting stand,or conveyor sidewall. In step 903, a power port of the adaptableinspection unit is connected to a power source. In step 904, a data portof the adaptable inspection unit is connected to a data communicationchannel. The data communication channel can be a wired or wirelesschannel. In step 905, the existing processing line is run with theadaptable inspection unit in place and executing. In step 906, theexisting processing line equipment is capable of performing automatedinspection.

FIG. 42 is a flowchart 910 illustrating the operations performed by anadaptable sorting unit. In step 911, an attachment mechanism isconnected to the adaptable sorter unit. In step 912, the attachmentmechanism is connected to the existing processing line. This can be aconnection directly to the existing processing line or to an object nearthe existing processing line, such as a wall, ceiling, mounting stand,or conveyor sidewall. In step 913, a power port of the adaptable sorterunit is connected to a power source. In step 914, a data port of theadaptable sorter unit is connected to a data communication channel. Thedata communication channel can be a wired or wireless channel. In step915, the existing processing line is run with the adaptable sorter unitin place and executing. In step 916, the existing processing lineequipment is capable of performing automated sorting.

Given the new methods and apparatuses disclosed above, an existingprocessing line can be quickly and inexpensively retrofitted to performautomated inspection and automated sorting, which results in (i)improved inspection quality and reliability, (ii) improved sortingaccuracy and reliability, (iii) improved throughput capability, and (iv)reduced operating costs.

The exemplary embodiments described above discuss adaptable inspectionunits and adaptable sorter units attached to a conveyor. However, oneskilled in the art will readily appreciate that the adaptable inspectionunits and adaptable sorter units may also be attached to any other typeof existing processing line, such as a chute in a similar manner toattain similar functionality and benefits.

Vacuum Adaptable Sorting Unit

As disclosed above, many different sorting methods may be implemented inan adaptable sorting unit. One of those sorting methods includesgenerating a vacuum that is applied to specific samples so to sort themout from a group of samples.

Vacuum sorting is desirable due to its high level of performance andcontrollability. However, the presence of a vacuum source in sortingfacilities is rare. Moreover, installation of vacuum systems in sortingfacilities is prohibitively expensive. Therefore, implementation of avacuum sorting system has been economically infeasible.

While vacuum sources are rare in sorting facilities, pressurized airsystems are often present in sorting facilities. If one we able tocreate a vacuum sorting unit utilizing a pressurized air system, thenimplementation of a vacuum sorting system would not be prohibitivelyexpensive. A solution for implementing a vacuum sorting unit using apressurized air system is disclosed herein.

An exemplary setup is illustrated in FIG. 43. A conveyor 1,000 is usedto propel samples from left to right. An adaptable inspection unit 1,002is used to capture one or more images of the samples as they within thefield of view of the adaptable inspection unit 1,002. In one example,the adaptable inspection unit is a optical inspector. Each of the imagesis processed to determine the location of each sample on the conveyorand whether or not each sample should be sorted. If the decision is thata sample should be sorted, then the location and timing of the vacuumapplication to the sample is calculated. When the sample is locatedwithin the vacuum suction area of adaptable sorting unit 1,004, thevacuum is activated and the sample to be sorted 1,006 is sucked into theadaptable sorting unit 1,004.

The inspection of the one or more images acquired by the adaptableinspection unit 1,002 are stored in a memory and processed by aprocessor. The location and timing of the vacuum application to thesample is calculated by the processor. In one example, the memory andprocessor are included in adaptable inspection unit 1,002. In anotherexample, the one or more images acquired by the adaptable inspectionunit 1,002 are communicated to a memory and processor located outside ofthe adaptable inspection unit 1,002. The adaptable inspection unit 1,002includes a communication modem. The communication modem can be anycommunication modem well known in the art. In one example, the modem isa wired technology such as Ethernet. In another example, the modem is awireless technology, such as WiFi or cellular (4G/5G) that utilizesantenna 1,003.

Control of the adaptable sorter unit 1,004 is performed, at least inpart, by a processor and a memory. In one example, the processor andmemory may be included in the adaptable sorter unit 1,004. In anotherexample, the processor and memory are located outside of the adaptablesorter unit 1,004. The adaptable sorter unit 1,004 includes acommunication modem. The communication modem can be any communicationmodem well known in the art. In one example, the modem is a wiredtechnology such as Ethernet. In another example, the modem is a wirelesstechnology, such as WiFi or cellular (4G/5G) that utilizes antenna1,005.

FIG. 44 is a more detailed diagram of the adaptable sorter unit 1,004.The adaptable sorter unit 1,004 includes a venture vacuum 1,001 and apneumatic valve 1,010. Optionally, the adaptable sorter unit 1,004 mayalso include a sorted sample container 1,012 and an optional antenna1,005 to allow wireless communication with the adaptable sorter unit.1,004. The venture vacuum 1,011 includes an inlet 1,007 and an outlet1,008. The pneumatic valve 1,010 includes a pressurized air inlet 1,009.

In operation, a pressurized air source is connected to the compressedair inlet 1,009 of pneumatic valve 1,010. The pneumatic valve 1,010 iscontrolled by an electrically controlled valve. When a first electriccontrol signal is present on the pneumatic valve input terminal, thevalve is closed. When a second electric control signal is present on thepneumatic valve input terminal, the valve is opened. In this fashion,the adaptable sorter unit 1,004 is engaged and disengaged.

In one example, the pneumatic valve includes a solenoid. The solenoidreceives the electrical control signal which causes the solenoid to moveinside the pneumatic valve so that the pneumatic air supplied throughthe compressed air inlet 1,010 can flow through the valve.

The output of the pneumatic valve 1,010 is connected to the pressurizedair input of the venturi vacuum 1,011. The venture vacuum 1,011 therebycreates a vacuum force at inlet 1,007 and an outward force at outlet1,008. The operation of the venture vacuum 1,011 is illustrated in FIG.45. It is noted that the illustration of FIG. 45 is only exemplary andis not required to implement the venturi vacuum 1,011. Pressurize air isapplied to the nozzle 1,013 where air stream carries along ambient airin its turbulence and then passes through the mixer 1,014 on its wayout. This suction of ambient air creates a depression that generates thevacuum at inlet 1,007. The vacuum forces at inlet 1,007 can be setstrong enough to suck up a sample of desired weight and size through theinlet 1,007 and out of the outlet 1,008.

Once the sample is output through the outlet 1,008, the sample may landin a sorted sample container 1,012 (optional). In this fashion, all thesorted samples can be stored and routed to desired bins of samples.

It is noted that the sorted sample container 1,012 can also be a bucketor container that is positioned on the side of the conveyor. In thiscase, they may be a chute or flex hose going from the outlet 1,008 intothe bucket or container.

In another embodiment (not shown) a baseline vacuum control valve may beused in addition to the pneumatic valve disclosed above. Creating avacuum, with the venturi system in combination with the pneumatic valve,may take a large amount of time to generate the vacuum force necessaryto sort a sample. In order to decrease that amount of time need togenerate the necessary vacuum force, a baseline vacuum control valve canbe added. The purpose of this baseline vacuum control valve is toprepare a baseline vacuum force that is not strong enough to move asample, but decreases the time necessary to increase the vacuum force tothe level necessary to move a sample. In operation, as soon as theadaptable inspection unit captures an image of the sample, the baselinevacuum control valve will be actuated. As the baseline vacuum controlvalve will work on a lower incoming air pressure than the main pneumaticvalve, it will create a baseline vacuum force. Samples will not be movedby this baseline vacuum force because of the low suction force. Once thesample is within vacuum range, the main valve will open and the vacuumwill build up for its maximum level and thereby move the sample. In thisfashion, the baseline vacuum control valve is a preparation stage inwhich the vacuum is partially created (baseline vacuum force). The mainvalve is then only opened to quickly generate the full vacuum forcenecessary to move the sample.

In yet another embodiment, the pneumatic valve can be partially turnedon by adjusting the frequency of the electrical control signal. Inoperation, when a sample to be sorted is detected, the frequency of theelectrical control signal is sent to the pneumatic valve. The frequencyis set so that over time the average amount of pressurized air letthrough the valve is less than the maximum amount of pressurized airthat can pass through the valve when the valve is completely open over along time period. The valve will switch on when the electrical controlsignal is high and off when the electrical control signal is low. Ifthis occurs at fast enough rate, when seen over time, the effect is thesame as if the valve were fixed at a partially open position. This wouldcreate a baseline vacuum force with a low air flow that is not strongenough to move a sample into the adaptable sorter unit. When the sampleis within vacuum range, the electrical control signal changes towards asteady high (active) electrical control signal, thereby completelyopening the valve and creating a full vacuum in the venturi systemnecessary to the sample into the adaptable sorting unit.

FIG. 46 is a front-view diagram of an adaptable inspection unit andvacuum adaptable sorter unit utilizing pressurized air with x-y-zlocation adjustment. The location of the adaptable sorter unit may beadjusted in all three dimensions (x,y,z).

The z-dimension may need to be adjusted to set the optimal height of theadaptable sorter unit so that the vacuum can be maximally applied topassing samples while ensuring that the sample do not come into directcontact with the adaptable sorter unit housing.

The x-y dimension can be adjusted so to properly position the adaptablesorter unit so it is able to apply a vacuum force to the desired sampleon the conveyor. In this fashion, a single adaptable sorter unit can beused to sort all samples on a single conveyer. In operation, theadaptable inspection unit acquires images used to determine the locationof all samples that require sorting, then the location information isused to position and trigger the adaptable sorter unit so that thedesired sample is sorted. In one example, the adaptable inspection unitis attached to a movable arm that receives a location control signal. Inone example, the location control signal includes coordinateinformation. Any automated movement technologies known in the art can beused to adjust the location of the adaptable inspection unit. Anylocation control technologies known in the art can be used tocommunicate the location information. The location informationcalculated by a processor, based at least in part, on an image capturedby the adaptable inspection unit. The processor then causes locationinformation to be sent to the adaptable sorter unit. The adaptablesorter unit then uses the location information to adjust the position ofthe adaptable sorter unit.

The triggering of the adaptable sorter unit is caused by a processor. Inone example, the processor calculates the time when the adaptable sorterunit is to be turned on, based at least in part on an image captured bythe adaptable inspection unit. In one example, the processor outputs atrigger signal that is communicated to the adaptable sorter unit. Inresponse to receiving the trigger signal, the adaptable sorter unitapplies the vacuum.

FIG. 47 is a top-down diagram of an adaptable inspection unit and vacuumadaptable sorter unit utilizing pressurized air with x-y-z locationadjustment. This diagram further illustrates the operation of theadaptable sorter unit with x-y-z location adjustment. The samples on theconveyor move in the direction 1,015. In one example, the adaptableinspection unit 1,002 has a viewable inspection area 1,016. As samplepass through the viewable inspection area 1,016, one or more images ofeach sample are captured. The one or more images of each sample are usedto determine if each sample is to be sorted. If a sample is to besorted, then the adaptable sorter unit 1,004 is moved to location alongthe path of the sample moving along the conveyor. Then, once the sampleis within the vacuum range of the adaptable sorter unit 1,004 theadaptable sorter unit 1,004 is activated by opening the pneumatic valvethereby causing the vacuum force and sucking the sample up from theconveyor and into the adaptable sorting unit 1,004. All unsorted samplescontinue along the conveyor.

FIG. 48 is a front-view diagram of an adaptable inspection unit andarray of fixed location vacuum adaptable sorter units utilizingpressurized air. The adaptable sorter unit array 1,017 includes nineadaptable sorter units (A-I). In one example, the number of adaptablesorter units is determined by the width of the conveyor and the width ofthe adaptable sorter unit so that the entire width of the conveyor iscovered by at least one adaptable sorter unit.

FIG. 49 is a top-down diagram of an adaptable inspection unit and arrayof fixed location vacuum adaptable sorter units utilizing pressurizedair. In operation, samples flow in direction 1,019 along the conveyor. Asample first passes through the viewable inspection area 1,020 where oneor more images of the sample are acquired. The one or more images arethen used to determine if the sample is to be sorted. If the sample isto be sorted, then the location of the sample is used to control whichadaptable sorter unit (A-I) of the adaptable sorter unit array 1,017 isto be used to sort the sample. The timing at which the selectedadaptable sorter unit is triggered to enable the vacuum force iscalculated based at least in part on the time and location when theimage of the sample was captured and the speed at which the sampletravels along the conveyor. The selected adaptable sorter unit is thentriggered at the calculated time so to sort the sample. All unsortedsamples continue along the conveyor.

FIG. 50 is a perspective diagram of an adaptable inspection unit andarray of fixed location vacuum adaptable sorter units utilizingpressurized air. As described regarding FIG. 49, the sample moves alongthe conveyor. First, one or more images of the sample are captured bythe adaptable inspection unit 1,018. The one or more images of thesample are then used to select at least one of the adaptable sorterunits in the adaptable sorter unit array 1,017. The selected one or moreadaptable sorter units are then triggered (turned on) when the sample iswithin the vacuum force of the adaptable sorter unit.

FIG. 50 also illustrates an example were the sorted sample container ofeach adaptable sorter unit are connected together. This configurationallows all the sorted samples from each adaptable sorter unit to flow tothe same sample sorting bin. It is noted that in other examples one ormore adaptable sorter units may have individual sorted sample containersso that the sorted samples are not binned together.

It is noted that the sorted sample container can also be a bucket orcontainer that is positioned on the side of the conveyor. In this case,they may be a chute or flex hose going from the outlet into the bucketor container.

It is also noted, that while the above examples discuss a conveyor, thesame adaptable system can be implemented on any processing line, such asa chute.

FIG. 51 is a flowchart 1,030 describing the steps of enabling a vacuumadaptable sorter unit that utilizes pressurized air. In step 1,031, theattachment mechanism is connected to the adaptable sorter unit. In step1,032 the attachment mechanism is attached to the existing processingline. In step 1,033, a pressurized air line is connected to thepressurized air inlet. In step 1,034, pneumatic valve control isconnected to the pneumatic valve. In step 1,035, the existing processingline is run as normal. In step 1,036, the processing line equipment isnot able to perform sample sorting using vacuum sorting.

Although certain specific embodiments are described above forinstructional purposes, the teachings of this patent document havegeneral applicability and are not limited to the specific embodimentsdescribed above. Accordingly, various modifications, adaptations, andcombinations of various features of the described embodiments can bepracticed without departing from the scope of the invention as set forthin the claims.

What is claimed is:
 1. An adaptable sorter unit, comprising: anattachment mechanism; a device that is capable generating a vacuum; apressurized air inlet; and a valve, wherein the pressurized air inlet isconnected to the valve, and wherein the valve controls a flow ofpressurized air through the device.
 2. The adaptable sorter unit ofclaim 1, wherein the valve is electronically controlled.
 3. Theadaptable sorter unit of claim 1, wherein the valve is pneumaticallycontrolled.
 4. The adaptable sorter unit of claim 1, wherein the valveis controlled by a processor circuit configured to receive data andtransmit an electrical control signal.
 5. The adaptable sorter unit ofclaim 4, wherein the data received by the processor circuit is a sortinginstruction.
 6. The adaptable sorter unit of claim 4, wherein the datareceived by the processor circuit is a sample characteristic data. 7.The adaptable sorter unit of claim 1, wherein a location of theadaptable sorter is adjustable in one or more dimensions.
 8. Theadaptable sorter unit of claim 7, wherein the location of the adaptablesorter is determined, at least in part, by data captured by an opticalinspector, and wherein the location of the adaptable sorter iscontrolled by a processor circuit configured to receive data andtransmit a location information.
 9. The adaptable sorter unit of claim1, wherein a location of the adaptable sorter is fixed.
 10. Theadaptable sorter unit of claim 1, wherein the valve is configured toopen when a sample is within a vacuum range of the adaptable sorterunit.
 11. The adaptable sorter unit of claim 1, further comprising abaseline vacuum control valve that when open causes a baseline vacuumforce to be applied by the adaptable sorter unit.
 12. The adaptablesorter unit of claim 1, wherein the adaptable inspection unit isattached using the attachment mechanism, and wherein the attachmentmechanism includes a mounting bracket, a mounting bracket receptacle, aweldable material, a clamp, an adhesive, a magnet, a latch, a lock, alocating pin, a rail, a slide, locking pin, a bolt, or a screw.
 13. Theadaptable sorter unit of claim 1, wherein an electrical control signalis used to open the valve, and wherein the frequency of the electricalcontrol signal is used to control the amount of time the valve is openedduring a duration.
 14. The adaptable sorter unit of claim 13, wherein anincrease in the frequency of the electrical control signal causes anincrease in the amount of time the valve is open during the duration.15. The adaptable sorter unit of claim 1, wherein the adaptable sorterunit is configured to be located above a conveyor.
 16. The adaptablesorter unit of claim 1, wherein the adaptable sorter unit is configuredto be located proximate to the end of a conveyor.
 17. The adaptablesorter unit of claim 1, wherein the adaptable sorter unit is configuredto be located above a chute.
 18. The adaptable sorter unit of claim 1,wherein the adaptable sorter unit is configured to be located proximateto the end of a chute.
 19. The adaptable sorter unit of claim 4, whereinthe data received by the processor circuit is a percentage of samples tobe removed.
 20. The adaptable sorter unit of claim 1, wherein the deviceis a venturi vacuum.